The purpose is to simulate the long-term operation of the product under normal usage conditions in a relatively short period of time, in order to expose potential defects (such as early failure of components, poor soldering, design defects, etc.) at an early stage and improve the reliability of the factory products.
How to conduct aging testing?
1. High temperature long-term full load aging test;
By accelerating the aging of electronic components at high temperatures, connect the adapter to the electronic load meter and apply the rated load to it. (Usually maximum rated load, or specific load point set according to standards/customer requirements).
Attention: The usual temperature is 40 ° C-50 ° C, and the aging time is generally 48 hours to 168 hours. During testing, pay attention to whether there are significant fluctuations in the output voltage of the adapter, and whether the product has any abnormal phenomena such as odor, smoke, ignition, or abnormal noise.
Wiring diagram for electronic load aging test
2. Dynamic load aging:
Simulate the dynamic changes in load current during actual use (such as device startup, standby, and peak operation), and investigate the response speed, stability, and stress tolerance of components (especially output capacitors, inductors, and feedback loops) of the power adapter during load transients.
Use an electronic load gauge to set up dynamic testing, allowing the load to periodically jump between low current (10% load of the adapter) and high current (90% -100% load of the adapter).
Attention: Pay attention to the transient response of the output voltage during load jump during the testing process, such as overshoot/undershoot amplitude and recovery time.
What load to use for aging testing:
Recommend the Meiruike RK8510 load, which can cover all aspects of power adapter aging experiments through constant current, constant voltage, constant power, and dynamic testing; The instrument price is economical and affordable; Equipped with overcurrent, overvoltage, overload, over temperature, and polarity reversal protection measures, making testing safer for users. It can be connected to the upper computer software through a communication interface (free software) to display test data in real-time on the computer.
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Post time: Mar-20-2026




